JPH0611469Y2 - プローブ周波数特性補償装置 - Google Patents
プローブ周波数特性補償装置Info
- Publication number
- JPH0611469Y2 JPH0611469Y2 JP9222788U JP9222788U JPH0611469Y2 JP H0611469 Y2 JPH0611469 Y2 JP H0611469Y2 JP 9222788 U JP9222788 U JP 9222788U JP 9222788 U JP9222788 U JP 9222788U JP H0611469 Y2 JPH0611469 Y2 JP H0611469Y2
- Authority
- JP
- Japan
- Prior art keywords
- frequency characteristic
- probe
- oscilloscope
- measurement result
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9222788U JPH0611469Y2 (ja) | 1988-07-12 | 1988-07-12 | プローブ周波数特性補償装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9222788U JPH0611469Y2 (ja) | 1988-07-12 | 1988-07-12 | プローブ周波数特性補償装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0214069U JPH0214069U (en]) | 1990-01-29 |
JPH0611469Y2 true JPH0611469Y2 (ja) | 1994-03-23 |
Family
ID=31316680
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9222788U Expired - Lifetime JPH0611469Y2 (ja) | 1988-07-12 | 1988-07-12 | プローブ周波数特性補償装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0611469Y2 (en]) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0648427Y2 (ja) * | 1988-11-09 | 1994-12-12 | 日立電子株式会社 | オシロスコープのプローブ容量校正回路 |
JP5348389B2 (ja) * | 2008-11-17 | 2013-11-20 | 横河電機株式会社 | オシロスコープ |
US8564308B2 (en) * | 2009-09-30 | 2013-10-22 | Tektronix, Inc. | Signal acquisition system having reduced probe loading of a device under test |
US8436624B2 (en) * | 2009-09-30 | 2013-05-07 | Tektronix, Inc. | Signal acquisition system having reduced probe loading of a device under test |
US8278940B2 (en) * | 2009-09-30 | 2012-10-02 | Tektronix, Inc. | Signal acquisition system having a compensation digital filter |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5739097B2 (ja) | 2009-12-16 | 2015-06-24 | 京楽産業.株式会社 | 遊技機 |
-
1988
- 1988-07-12 JP JP9222788U patent/JPH0611469Y2/ja not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5739097B2 (ja) | 2009-12-16 | 2015-06-24 | 京楽産業.株式会社 | 遊技機 |
Also Published As
Publication number | Publication date |
---|---|
JPH0214069U (en]) | 1990-01-29 |
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